Unggahan by Vijay Rajaindran

75 Wafers run

300 Wafers run

Metallic Data - F573

Metalic Data - F534

Surveillance of metallic impurities 1

Zinc Contamination

Contengency Plan - TXRF

JD Safety Officer

ffront cover

Fats and Derivatives of Fats Consist of Mixtures of Components Differing in Chain Length and Saturation

Installation Plan for WD0 & 1-20130913

Compare WD0 & WD1

Book1

New Microsoft Office PowerPoint Presentation

Rubicon DWO Room Renovation Works - Rev 1

WD1 1st and 2nd Quotation

PLEX

PLEX 2

PLEX 1

PLEX - WD1

Pioneer - Cheah2

Pioneer - Cheah1

Pioneer - Cheah

ITech Quest

Stain

Rework Procedure

Ultrasonic Testing

Metal data.xlsx

1

Area Process Engineer.docx

500 Wafers 4th Run - 18 July

TXRF - Metal Impurities

Surveillance of Metallic Impurities

6 Sept 2013

Peregrine Metal Surveillance Log

Comparison of 5s to 10s Data Pt

Action Plan

Appmanual Corr

4 Contamination Control 2

Balazs

Balazs.pdf

Audit Summary Ontrack

Ontrack Detail Investigation

153362927-ISO-MANUAL

Documents of Daily Check Sheets for WDs and CR10K_20130530

CR10k and CR100 Audit Summary Tracking

Conclusion

ETR Closure

ETR - WD0 Qualification